Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/127004
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dc.contributor.authorKhan Maaz
dc.date.accessioned2017-04-30T13:25:34Z-
dc.date.available2017-04-30T13:25:34Z-
dc.date.issued2012
dc.identifier.isbn978-953-51-0450-6
dc.identifier.urihttp://hdl.handle.net/123456789/127004-
dc.description.abstractThe book "The Transmission Electron Microscope" contains a collection of research articles submitted by engineers and scientists to present an overview of different aspects of TEM from the basic mechanisms and diagnosis to the latest advancements in the field. The book presents descriptions of electron microscopy, models for improved sample sizing and handling, new methods of image projection, and experimental methodologies for nanomaterials studies. The selection of chapters focuses on transmission electron microscopy used in material characterization, with special emphasis on both the theoretical and experimental aspect of modern electron microscopy techniques. I believe that a broad range of readers, such as students, scientists and engineers will benefit from this book.
dc.language.isoeng
dc.publisherInTech
dc.relation.isbasedon10.5772/1977
dc.relation.urihttp://www.intechopen.com/books/the-transmission-electron-microscope
dc.rights.uriCC by (姓名標示)
dc.sourceInTech
dc.subject.classificationMaterials Science
dc.titleThe Transmission Electron Microscope
dc.type電子教課書
dc.classification應用科學類
Theme:教科書-應用科學類

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