Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/138719
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dc.contributor.authorZohni, Wael
dc.date.accessioned2019-09-01T09:10:15Z-
dc.date.available2019-09-01T09:10:15Z-
dc.date.issued2018
dc.identifier.isbn9783845293097
dc.identifier.urihttp://oers.taiwanmooc.org/jspui/handle/123456789/138719-
dc.language.isoeng
dc.publisherNomos Verlagsgesellschaft mbH & Co. KG
dc.relation.urihttps://www.nomos-elibrary.de/10.5771/9783845293097
dc.rights.uriCC BY-NC-ND (姓名標示-非商業性-禁止改作)
dc.sourceDOAB
dc.subject.classificationLaw
dc.subject.otherPatent
dc.subject.otherApple
dc.subject.otherHistorical Comparison
dc.subject.otherHistorical Proposal
dc.subject.otherPatent Quality
dc.subject.otherPatent War Litigation
dc.subject.otherRestorative Patent System
dc.subject.otherSamsung
dc.subject.otherWright
dc.subject.otherCurtiss
dc.subject.otherUSPTO
dc.subject.otherpatent examination
dc.subject.otherpatent prosecution
dc.subject.otherUSPTO history
dc.titleExamining the Role of Patent Quality in Large-Scale ""Patent War"" Litigation
dc.type電子教科書
dc.classification社會科學類
Theme:教科書-社會科學類

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