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標題: Recent Interferometry Applications in Topography and Astronomy
作者: Ivan Padron
公開日期: 2012
出版社: InTech
摘要: This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.
連結: http://www.intechopen.com/books/recent-interferometry-applications-in-topography-and-astronomy
關鍵字: Engineering
ISBN: 978-953-51-0404-9
主題:教科書-應用科學類

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