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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Victor Bellitto | |
dc.date.accessioned | 2017-04-30T13:31:38Z | - |
dc.date.available | 2017-04-30T13:31:38Z | - |
dc.date.issued | 2012 | |
dc.identifier.isbn | 978-953-51-0414-8 | |
dc.identifier.uri | http://hdl.handle.net/123456789/131113 | - |
dc.description.abstract | With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development. | |
dc.language.iso | eng | |
dc.publisher | InTech | |
dc.relation.isbasedon | 10.5772/2673 | |
dc.relation.uri | http://www.intechopen.com/books/atomic-force-microscopy-imaging-measuring-and-manipulating-surfaces-at-the-atomic-scale | |
dc.rights.uri | CC by (姓名標示) | |
dc.source | InTech | |
dc.subject.classification | Chemistry | |
dc.subject.classification | Electrochemistry | |
dc.title | Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale | |
dc.type | 電子教課書 | |
dc.classification | 自然科學類 | |
Theme: | 教科書-自然科學類 |
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