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Title: | Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale |
Authors: | Victor Bellitto |
Issue Date: | 2012 |
Publisher: | InTech |
Abstract: | With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development. |
link: | http://www.intechopen.com/books/atomic-force-microscopy-imaging-measuring-and-manipulating-surfaces-at-the-atomic-scale |
Keywords: | Chemistry; Electrochemistry |
ISBN: | 978-953-51-0414-8 |
Theme: | 教科書-自然科學類 |
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